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Lee, H. (1986). An automatic test pattern generation in the logic gate level circuits and MOS transistor circuits at Ohio University. (Electronic Thesis or Dissertation). Retrieved from https://etd.ohiolink.edu/

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Lee, Hoon-Kyeu. "An automatic test pattern generation in the logic gate level circuits and MOS transistor circuits at Ohio University." Electronic Thesis or Dissertation. Ohio University, 1986. OhioLINK Electronic Theses and Dissertations Center. 19 Apr 2014.

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Lee, Hoon-Kyeu. "An automatic test pattern generation in the logic gate level circuits and MOS transistor circuits at Ohio University." Electronic Thesis or Dissertation. Ohio University, 1986. https://etd.ohiolink.edu/

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