Doctor of Philosophy, The Ohio State University, 2023, Electrical and Computer Engineering
Rough surface scattering is an essential aspect of modern remote sensing research, as virtually all real-world surfaces exhibit some degree of roughness whose effects cannot be adequately accounted for using simple planar surfaces. However, knowledge of what each rough surface model is capable of is critical, as choosing an appropriate model will aid in providing accurate results while minimizing the computational cost incurred. To explore these capabilities, four studies were conducted to assess how various rough surface scattering models fare in scenarios of current interest to the remote sensing community. The first two studies involve the Kirchhoff approximation (KA), with the first study assessing its applicability when the normalized coherent reflected field (which the KA is commonly used to model) is -20dB or lower, and the second study comparing it to a second-order correction term based on the second-order small slope approximation (SSA2) for ocean surface scattering. The first study shows that the KA continues to be applicable for such low amplitude cases, and the second study shows that the second-order correction shows no marked improvement over the base KA overall. The third study uses the SSA2 to validate retrieved zero-Doppler delay waveforms as part of a campaign to explore off-specular ocean scattering, and found the model waveforms to match the retrieved waveforms well in most cases considered. The fourth and final study uses simulated SAR imagery to determine under what conditions a monostatic radar system will observe the same surface scattering as a bistatic radar system, and revealed that cases with near-normal incidence angles and minor roughness yield the best agreement, with effects such as shadowing and multiple reflections accounting for most of the disagreements.
Committee: Joel Johnson (Advisor); Fernando Teixeira (Committee Member); Robert Burkholder (Committee Member)
Subjects: Electrical Engineering; Electromagnetics; Physics; Remote Sensing