Master of Science, University of Akron, 2006, Physics
Dielectric materials have been widely used in electronic industry. Recently an oxide ceramic CaCu3Ti4O12 (denoted as CCTO) is reported to be very promising because it possesses a very high dielectric constant. However, further research on its dielectric properties indicates that this material has a high dielectric loss, which seriously blocks its practical application. In this work, pure CCTO ceramic, and two series of CCTO derivatives, i.e., “CCTO + CaTiO3” and “CCTO + MnO2” ceramics were prepared, and their phase assemblies, structure, dielectric properties, and conducting properties are studied. The relaxation mechanism was investigated for CCTO and its derivatives. It is for the first time revealed that the relaxation time follows the Vogel-Fulcher relation instead of the Arrhenius relation.
Committee: Ang Chen (Advisor)
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