Doctor of Philosophy, Case Western Reserve University, 2025, EECS - System and Control Engineering
In the context of artificial intelligence (AI) with a focus on machine learning (ML) and deep learning (DL), variability and generalizability are key challenges that significantly impact model performance and applicability across diverse real-world scenarios. Variability refers to the inconsistencies in data quality, feature extraction, and model outcomes that arise due to differences in data settings, populations, and other external factors. Generalizability, on the other hand, denotes a model ability to maintain robust performance when applied to new, unseen data beyond the specific conditions it was trained on. Tackling these challenges is critical to enable the broader adoption of ML and DL models, particularly in high-stakes fields such as medical imaging and signal processing, where reliable and consistent performance is essential. Addressing these issues requires systematically dividing the AI workflow into three primary stages: pre-analytical, analytical, and post-analytical. Each stage presents unique challenges, and this work introduces novel methods to address them, thereby improving the overall robustness, performance, and generalizability of AI models.
In the pre-analytical stage, we propose new quality control mechanisms for medical imaging data, including the development of MRQy, a tool for automated MRI quality assessment, and DeepQC, a DL-based framework that leverages ResNet18 for detecting artifacts such as noise and motion. These innovations ensure that the data fed into AI models is clean, consistent, and suitable for analysis, minimizing biases that can degrade model performance.
The analytical stage introduces several wavelet-based architectures to enhance feature extraction and model building. Key contributions include Sparse Wavelet Networks (SWN), Deep Hybrid Con-volutional Wavelet Networks (DHCWN), and Residual Wavelon Convolutional Networks (RWCN). These architectures improve the ability to capture multi-scale and complex patterns, part (open full item for complete abstract)
Committee: Satish Viswanath (Advisor); Wei Lin (Committee Member); Vira Chankong (Committee Member); Kenneth Loparo (Committee Chair)
Subjects: Electrical Engineering