Master of Science, University of Akron, 2009, Electrical Engineering

The main purpose of this research study was to explore the potential application of polarimetric principles in characterization and monitoring of space materials. Space monitoring and collision avoidance between space vehicles and inter-space debris has become a major concern for space agencies and authorities maintaining satellites, space shuttles and stations. Inter-space debris can be man-made or natural. As the quantity of space debris increases, tracking and collision avoidance becomes a critical issue. The novelty of this study consists in the single pixel analysis of back scattered optical polarimetric signatures from various space materials. Surface characterization of different materials was performed by analysis of their polarization response. The study employed single-pixel detection of back scattered laser beam polarimetric signatures obtained from different materials. The back scattered optical polarimetric signatures contained major information related to geometry, texture and composition of the material. The DOLP (Degree of Linear Polarization) algorithm was applied to analyze polarization response from the different materials used in this study. Different materials used in space vehicle design were examined and the DOLP ratio was calculated at different material and detector orientations. On examining Teflon, which is a soft polymer material used in space vehicle design, we observed high depolarization of light. This was due to the “Diffuse reflectance” nature of Teflon at different object orientations. Hence, Teflon can be identified as a “Lambertian surface” exhibiting high depolarization of light. The polarization response exhibited by materials such as windowless polysilicon solar panel and a wooden stick painted in white color mixed with titanium dioxide was found to be similar to the response exhibited by Teflon. It was observed that the extent of depolarization exhibited by different materials was found to be distinct and depended on materia (open full item for complete abstract)

Committee: George Giakos Dr. (Advisor) Subjects: Electrical Engineering