Doctor of Philosophy (PhD), Ohio University, 2024, Mechanical and Systems Engineering (Engineering and Technology)
In this research, we develop an innovative approach to assessing the reliability of complex
engineering systems, which are typically characterized by multiple interdependent
performance characteristics (PCs). Recognizing that the degradation of these PCs often
follows a positive, increasing trend, we employ the gamma process as the foundational
model for degradation due to its properties of independent and non-negative increments.
A critical aspect of our model is the incorporation of random-effect bivariate
Gamma process degradation models, which utilize a variety of copula functions. These
functions are instrumental in accurately modeling the dependency structure between the
PCs, a factor that significantly influences the overall system reliability.
In conventional degradation modeling, fixed and predetermined failure thresholds
are commonly used to determine system failure. However, this method can be inadequate
as different systems may fail at varying times due to uncontrollable factors. Our model
addresses this limitation by considering random failure thresholds, which enhances the
accuracy of predicting when a system might fail.
We implement a hierarchical Bayesian framework for the degradation modeling,
data analysis, and reliability prediction processes. This approach is validated through the
analysis of a practical dataset, demonstrating the model's applicability in real-world
scenarios.
Furthermore, our study responds to the increasing market demand for
manufacturers to provide reliable information about the longevity of their products.
Manufacturers are particularly interested in the 100p-th percentile of a product's lifetime
distribution. Degradation tests are vital for this, as they offer insights into the product's
lifespan under various conditions over time. Utilizing our proposed model, we propose a
method for designing degradation tests. This method optimizes the number of systems to
be tested, the (open full item for complete abstract)
Committee: Tao Yuan (Advisor); Felipe Aros-Vera (Committee Member); Bhaven Naik (Committee Member); William Young (Committee Member); Ashley Metcalf (Committee Member)
Subjects: Industrial Engineering