Skip to Main Content
 

Global Search Box

 
 
 
 

Files

ETD Abstract Container

Abstract Header

Accelerated assessment and representation of materials behavior via integrated electron-optical, focused ion beam and MEMS-based characterization methods /

Polasik, Steven J.

Abstract Details

2005, Master of Science, Ohio State University, Graduate School.
Not Provided (Other)

Recommended Citations

Citations

  • Polasik, S. J. (2005). Accelerated assessment and representation of materials behavior via integrated electron-optical, focused ion beam and MEMS-based characterization methods / [Master's thesis, Ohio State University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=osu1731939224171511

    APA Style (7th edition)

  • Polasik, Steven. Accelerated assessment and representation of materials behavior via integrated electron-optical, focused ion beam and MEMS-based characterization methods /. 2005. Ohio State University, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=osu1731939224171511.

    MLA Style (8th edition)

  • Polasik, Steven. "Accelerated assessment and representation of materials behavior via integrated electron-optical, focused ion beam and MEMS-based characterization methods /." Master's thesis, Ohio State University, 2005. http://rave.ohiolink.edu/etdc/view?acc_num=osu1731939224171511

    Chicago Manual of Style (17th edition)