Skip to Main Content
 

Global Search Box

 
 
 
 

Files

File List


ohiou1183735748.pdf (1.89 MB)

ETD Abstract Container

Abstract Header

Noise analysis of multiport networks containing GaAs FETs based on measured data or physical FET parameters

Patience, William
http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1183735748

Abstract Details

1991, Master of Science (MS), Ohio University, Electrical Engineering & Computer Science (Engineering and Technology).
Noise analysis of multiport networks containing GaAs FETs based on measured data or physical FET parameters
Ebrahim Mokari (Advisor)
103 p.
Noise Analysis; Multiport Networks; GaAs FETs based on Measured Data; Physical FET Parameters

Recommended Citations

Citations

  • Patience, W. (1991). Noise analysis of multiport networks containing GaAs FETs based on measured data or physical FET parameters [Master's thesis, Ohio University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1183735748

    APA Style (7th edition)

  • Patience, William. Noise analysis of multiport networks containing GaAs FETs based on measured data or physical FET parameters. 1991. Ohio University, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1183735748.

    MLA Style (8th edition)

  • Patience, William. "Noise analysis of multiport networks containing GaAs FETs based on measured data or physical FET parameters." Master's thesis, Ohio University, 1991. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1183735748

    Chicago Manual of Style (17th edition)

ohiou1183735748
668
© 1991, all rights reserved.
This open access ETD is published by Ohio University and OhioLINK.