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Degree

Master of Science (MS), Ohio University, Electrical Engineering (Engineering), 1986.

Keywords

Automatic Test Pattern Generation; Logic Gate Level Circuits; MOS Transistor Circuits; Ohio University

Advisor

Janusz A. Starzyk

Pages

166p.

Document number: ohiou1183139647
Permalink: http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1183139647

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