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Degree

Doctor of Philosophy, Case Western Reserve University, Physics, 1992.

Abstract

X-ray Absorption Fine Structure (XAFS) spectroscopy was examined, for the first time, as a technique for the determination of elastic strain in thin evaporated films and thin foils. The electron yield and fluorescence yield detection techniques were used to collect the XAFS data. For sensitivity reasons, back-reflection X-Ray Diffraction (XRD) was also carried out. Continuum mechanics was used to model the deformation of the first shell and was compared to experimental observations. A local, non-linear elastic strain was observed by XAFS and is the same quantity measured by XRD. In general, the measured magnitude of the XAFS strain was found to be less than the model predicts, and relaxation of the stress in the substrate or the foil is suggested as the responsible mechanism.

Subject Headings

Physics, Condensed Matter

Keywords

X-ray absorption fine structure (XAFS); Thin films

Advisor

R. W. Hoffman

Pages

204p.

Document number: case1060005230
Permalink: http://rave.ohiolink.edu/etdc/view?acc_num=case1060005230

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